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Deconvolution of xps peak avantage software
Deconvolution of xps peak avantage software




deconvolution of xps peak avantage software

These results are illustrated for the S 2 p doublet from MoS 2 and the Ni 2 p peaks from oxidized stainless steel. If deconvolution is necessary, the counting times for both sources to achieve a given S/N ratio were found to depend mainly upon the signal-to-background ratios of the peak measured with each source. Results for the Kratos ES300 show that if the desired resolution could be achieved without deconvolution, an order of magnitude less counting time was needed for the Mg Kα standard source. Signal-to-noise ratios are used as a means of comparing spectral quality at a given resolution. can achieve data of a certain quality in the least amount of time, for a given system, namely a Kratos ES300 photoelectron spectrometer. Given these limitations, a comparison has been made to see which method of high resolution data acquisition. Whether working in a dedicated research lab or as a tool in a multi-user environment, users of all abilities can rely on the flexibility, feature-set, and intuitive operation of the Avantage software to obtain the maximum information from their samples. Monochromatic X-ray sources can give high resolution data directly, but the count rates are generally low. Deconvolution algorithms generally used also increase the noise in the spectrum. Deconvolution has been used by several workers to reduce or eliminate X-ray and analyzer-induced broadenings of XPS spectra, but there is a 30% limit on the amount of improvement in the FWHM of XPS peaks.






Deconvolution of xps peak avantage software